ITC 2017

International Test Conference (ITC) 2017

The International Test Conference (ITC) is the world's premier event dedicated to the electronic test of devices, boards, and systems. It encompasses the entire lifecycle from design verification and design-for-test to design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability, and failure analysis. The conference also emphasizes the importance of continuous improvement through process and design enhancements.

At ITC, professionals from various fields—including design, test, and yield—confront the challenges faced by the industry. They explore solutions developed through collaborative efforts between academia, design tool and equipment suppliers, designers, and test engineers. This year, the conference will focus on advancements in test technology within Asia and India. However, submissions are not limited to these regions. Topics related to Design for Test (DFT) and test development across multiple geographical regions will be particularly interesting and encouraged.

By attending ITC, participants gain insights into cutting-edge technologies and methodologies that address real-world problems. They have the opportunity to network with leading experts, share knowledge, and collaborate on innovative projects. Whether you're a seasoned professional or a newcomer to the field, ITC offers a platform to stay updated with the latest trends and best practices in electronic testing.